| Abstract: | The use of a new analytical technique for the elemental characterization of artefacts is described. The new equipment is capable of X‐ray fluorescence analysis in conventional mode as well as for elemental scanning of small objects, fragments or microsamples. The Omicron, manufactured by Kevex Instruments Inc., is equipped with a microfocused X‐ray tube, which can be collimated to a 50 μ beam and used to scan objects over a maximum range of 256 × 256 pixels. False‐colour elemental distribution maps allow the user to image small features, differently pigmented areas, or whole objects in the machine completely non‐destructively. Analyses can be carried out in air, under helium or in vacuum. Two examples of the application of the new technique are described: first, to the surface decoration on a Greek Attic white ground lekythos; and, second, to the pigments used on a small painting, a ‘Pittura’, on copper by the Dutch artist, Frans van Mieris (1635–81) in the collections of the J. Paul Getty Museum. |
