Computer programmes for the correction of matrix effects in the XRF analysis of glass,ceramics and related silicate systems |
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Authors: | G.A. Cox A.M. Pollard |
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Affiliation: | 1. Department of Physics, University of York, Heslington, York, England;2. Research Laboratory for Archaeology and the History of Art, University of Oxford, 6 Keble Road, Oxford UK |
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Abstract: | The quantitative analysis of glass, ceramics and related silicate systems by means of energy dispersive X-ray fluorescence spectrometry is considered and problems arising from the selective absorption of X-rays in multi-element specimens are discussed. A computer programme written in FORTRAN and based upon a “semi-fundamental parameters” approach to the correction of matrix effects in glass and chemically similar materials is fully described. Model data are provided to enable the programme to be run and tested. An “empirical coefficients” computer programme for the quantitative analysis of silicate systems is outlined and the limitations of this type of programme are pointed out. The importance of adequate sample preparation prior to X-ray spectrometric analysis is stressed. |
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Keywords: | X-ray fluorescence analysis X-ray spectrometry Absorption coefficient Matrix effect Semi-fundamental parameter Alpha coefficient Flow chart Computer programme Fortran language Glass Ceramic Silicate system |
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