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X-ray fluorescence imaging analysis of inscription provenance |
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| Authors: | J. Powers D.-M. Smilgies E.C. Geil K. Clinton N. Dimitrova M. Peachin R.E. Thorne |
| Affiliation: | 1. Department of Physics, Cornell University, Ithaca, NY 14853, USA;2. Cornell High-Energy Synchrotron Source, Ithaca, NY 14853, USA;3. Department of Classics, Cornell University, Ithaca, NY 14853, USA;4. Department of Classics, New York University, NY 10012, USA |
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